• Resize textA -AA +
  • Dark Mode Icon
  • en English
    en English hi Hindi te Telugu

A combined theoretical and experimental approach to deduce the role of dielectric layer on interface trap density in single crystal organic field‐effect transistors.

A combined theoretical and experimental approach to deduce the role of dielectric layer on interface trap density in single crystal organic field‐effect transistors.

Bhattacharya, A., Praveen, P. A., Rajan, R. Y. Y., & Thangavel, K. (2023). A combined theoretical and experimental approach to deduce the role of dielectric layer on interface trap density in single crystal organic field‐effect transistors. Crystal Research and Technology, 58(7).
DOI: 10.1002/crat.202200263