Atomic force microscopy (AFM) : Park Systems – NX 10

Measures the topographic image with resolution on the order of fractions of nanometers with low noise Z detector.
The NX10 AFM is equipped with a variety of imaging modes which include:
Standard modes:
Contact and LFM
Tapping mode
Non-Contact AFM
Magnetic Force Microscopy
Scanning Ion Conductance Microscopy (SICM)
Electrical measurements: Electrostatic Force Microscopy
Faculty Incharge: Dr. Ashwani Sharma